eTraining Introduction

Specimen Preparation

Leica Ultracut UCT

Histology

JEOL JSM-6400 SEM

Hitachi S-4700 FE-SEM

JEOL JEM-4000FX TEM

Microanalysis

Veeco Dim 3000 AFM

Fluorescence Microscopes

Support

Specimen Preparation

Preparation Options

Particle Dispersion

Common ways to prepare specimens for the TEM involve using particle dispersion methods on the specimen grid. Dry particle specimens can be dispersed on grids in two ways.

First, the grid may be placed (dipped) in the dry particles to coat the grid.

Second, a liquid suspension of the particles may be prepared using a volatile solvent or de-ionized water. A drop of this suspension is then placed on the grid and the solvent allowed to evaporate. Some particle specimens may already exist in solution and can be prepared using the previously mentioned process. Be careful about emulsions that are in suspension with the particles. They can coat your particles when the solvent dries, rendering clear imaging impossible.

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Sectioning

The Focused Ion Beam system may be used to prepared cut-outs from larger specimens.

Solid, polymeric materials can be thin sectioned using the ultramicrotome system. See also Leica Ultracut UCT.

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