eTraining Introduction

Specimen Preparation

Leica Ultracut UCT

Histology

JEOL JSM-6400 SEM

Hitachi S-4700 FE-SEM

JEOL JEM-4000FX TEM

Microanalysis

Veeco Dim 3000 AFM

Fluorescence Microscopes

Support

Advanced Imaging

Recording Diffraction Micrographs

NOTE: These instructions are only a guide to obtaining diffraction micrographs. Some trial and error may be required to obtain good results for a particular experiment.

NOTE: Never use the GATAN DIGITAL CAMERA for diffraction images.

1. Enter information about the specimen that will be printed on the film. With the KEYBOARD, type TEXT <RETURN>. Type the specimen information, then <RETURN>.

    

2. Locate a feature on the specimen and obtain a Convergent Beam Electron Diffraction (CBED) pattern on the fluorescent screen.

    
2.1. Locate a thin area of the specimen.
2.2. Insert and align Condenser Aperture 3 or 4 depending on the size of disc you want on the diffraction pattern.
2.3. Ensure that the OBJECTIVE APERTURE and SELECTED AREA APERTURE are in the out position.
2.4. Set the SPOT SIZE to 1.
2.5. Adjust the MAG to place the beam within the specimen area to be analyzed. VIEW
2.6. Focus the illumination to a spot using the BRIGHTNESS knob. VIEW
2.7. Engage FUNCTION, DIFF. VIEW
2.8. Set the SADIFF (camera length) to 2.5 n*m on Page 1 using the SELECTOR knob. VIEW
2.9. Center the transmitted beam using the DEFLECTOR, PROJ button and SHIFT X,Y knobs in the right-hand drawer. VIEW
2.10. Sharpen the edges of the diffracted beams with the DIFF FOCUS knob. VIEW
3. Engage the FOCUS, SCREEN button (Control Panel Left B). VIEW
4. Engage the SHUTTER, AUTO button (Control Panel Right). VIEW
5. Set to Page 1 by engaging the PAGE button in the right drawer. VIEW

6. Observe and make note of the EXP TIME on the CRT.

    
7. Disengage the FOCUS, SCREEN and SHUTTER, AUTO buttons. VIEW

8. Toggle the EXP TIME to:

    
8.1. 1/3 of the value you recorded in step 6 or
8.2. 10-20 seconds for barely visible CBED patterns.

9. Produce micrographs by following steps 10-13 in Recording Bright Field Micrographs under Advanced Imaging in JEOL JEM-4000FX TEM.

    

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