eTraining Introduction

Specimen Preparation

Leica Ultracut UCT

Histology

JEOL JSM-6400 SEM

Hitachi S-4700 FE-SEM

JEOL JEM-4000FX TEM

Microanalysis

Veeco Dim 3000 AFM

Fluorescence Microscopes

Support

Initial Alignment

Z Height Adjustment

See the TEM Alignment video in JEOL JEM-4000FX TEM.

1. Set the SPOT SIZE=1, MAG=~50 kX.

   
2. For the accelerating voltage you are using, choose the correct objective lens voltage from the table. See Heating the Filament under Operating Procedures in JEOL JEM-4000FX TEM.

   
3. Select Page 4 using the PAGE button and use the OBJ FOCUS knob to select the correct value. VIEW
4. Spread the beam using the BRIGHTNESS knob and find the area of interest. VIEW
5. Use the knob under the specimen holder on the SEG to adjust the holder up or down while observing the specimen. When contrast is minimized, the specimen is in the focal plane.

WARNING: Stop turning the Z height knob when you feel increased friction or resistance. Turning the knob past its end stop will result in expensive damage to the microscope.

NOTE: This height adjustment may need to be redone whenever the specimen stage tilt is changed and when moving to another area of the sample.
VIEW

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