eTraining Introduction

Specimen Preparation

Leica Ultracut UCT

Histology

JEOL JSM-6400 SEM

Hitachi S-4700 FE-SEM

JEOL JEM-4000FX TEM

Microanalysis

Veeco Dim 3000 AFM

Fluorescence Microscopes

Support

Initial Alignment

Gun Alignment

See the Interactive Alignment Demo in JEOL JEM-4000FX TEM.

WARNING USE CAUTION. THE BEAM MAY BE COMPLETELY LOST IF YOU ARE NOT CAREFUL.

1. Set the SPOT SIZE=1, MAG=~50 kX. Condense the beam to the smallest spot using the BRIGHTNESS knob. VIEW
2. Undersaturate the FILAMENT (slowly and slightly) until a cross inside a central bright spot is observed. VIEW
3. Engage the GUN button in right drawer. Disengage the X 10 button in the right drawer. VIEW

4. Using the DEF X,Y knobs in the right drawer, adjust the illumination so a perfect, symmetrical cross is centered in the bright spot. Readjust the brightness to "focus" the cross.

NOTE: This adjustment effectively tilts the electron beam at the gun. Only minimal adjustment should be necessary.

VIEW
5. Center the illumination using the GUN SHIFT X,Y in the drawer with reference spot on the fluorescent screen. VIEW

6. Repeat steps 4-5 if necessary.

NOTE: Focusing/Defocusing the beam while adjusting sometimes helps.

   
7. Disengage the GUN button. VIEW

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