eTraining Introduction

Specimen Preparation

Leica Ultracut UCT

Histology

JEOL JSM-6400 SEM

Hitachi S-4700 FE-SEM

JEOL JEM-4000FX TEM

Microanalysis

Veeco Dim 3000 AFM

Fluorescence Microscopes

Support

Initial Alignment

Condenser Double Deflector Alignment

NOTE: The specimen must be set to the correct height/objective focus before making these alignments. See Z Height Adjustment in JEOL JEM-4000FX TEM.

COND ALIGN TILT (Image Wobbler Adjustment)

1. Set the SPOT SIZE=1, MAG=~50 kX.

   
2. Focus beam to a spot using the BRIGHTNESS knob. VIEW
3. Engage the COND ALIGN, TILT button (in right drawer). VIEW
4. Toggle the DEF WOB, TILT X (in right drawer). VIEW
5. Minimize motion of illumination using the DEF X and SHIFT X (in right drawer). The flickering circles should converge to a single, stationary spot.

See the Interactive Alignment Demo in JEOL JEM-4000FX TEM.
VIEW

6. Repeat steps 4 - 5 for Y.

   
7. Disengage the DEF WOB, TILT and the COND ALIGN, TILT. VIEW
8. Center illumination with the SHIFT X, Y (on main panel).

NOTE: The voltage centering adjustment will be easier if you repeat this adjustment at a higher magnification.
VIEW

COND ALIGN SHIFT

1. Set the SPOT SIZE=1, MAG=~50 kX.

   
2. Turn the BRIGHTNESS knob fully clockwise. VIEW
3. Engage the DIFF mode button from the FUNCTION buttons on the right control panel. VIEW
4. Use the SELECTOR knob to set SADIFF = 1.0 nm. VIEW
5. Use the DIFF FOCUS to obtain the caustic spot. VIEW
6. Engage the COND ALIGN SHIFT. VIEW
7. Toggle the DEF WOB SHIFT to X (in the right drawer). VIEW
8. Use the SHIFT X and DEF X to minimize the motion. VIEW

9. Repeat steps 7 and 8 for Y.

   
10. Turn the DIFF off by depressing the button again. VIEW
11. Turn the BRIGHTNESS knob counterclockwise to a spot and center the beam. VIEW

Top of Page