eTraining Introduction

Specimen Preparation

Leica Ultracut UCT

Histology

JEOL JSM-6400 SEM

Hitachi S-4700 FE-SEM

JEOL JEM-4000FX TEM

Microanalysis

Veeco Dim 3000 AFM

Fluorescence Microscopes

Support

Initial Alignment

Condenser Astigmatism Correction

See the Interactive Alignment Demo in JEOL JEM-4000FX TEM.

1. Set the SPOT SIZE=1, MAG=~50 kX.

   
2. Condense the beam to the smallest spot using the BRIGHTNESS knob. VIEW
3. Engage the COND LENS STIGMATOR. VIEW
4. Turn on the X 10 button in the right-hand drawer. VIEW

5. Focus the filament image (cross) using the DEF X,Y knobs in the right drawer. The image will appear out of focus and oval-shaped as you focus/defocus the illumination. The astigmatism is corrected when the filament image (cross) is in sharp focus inside a round spot of illumination.

VIEW
6. Repeat steps 2-5 until the filament image is in sharp focus.    
7. Disengage the COND LENS STIGMATOR button. VIEW

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