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ACMAL eTraining
ACMAL eTraining Introduction
How to Use This Module
Specimen Preparation
Introduction
Preparation
Choosing the Preparation Method
Preparing Polished Specimens
Metallurgical
Mount Fabrication Procedure
Steel Etching Procedure
Steel Polishing Procedure
Thin Sections
Preparing Unpolished Specimens
Powders
Introduction
Jet Spraying
Lofting
Suspension
Odd Shapes - Fractures
Cryo Fracture Technique
Films
Electronic Materials and Carbon Nanotubes
Multiprep Polishing Procedure
Handling
Coating
Specimen Coating
Reasons for Coating
Metal Coating Procedure
Carbon Coating Procedure
Holders
Introduction
Specimen Holders by Instrument
Leica Ultracut UCT
Overview
Interactive Parts Tour
Operating Procedures
Histology
Overview
Chemicals and Materials
Procedure
Solution Preparation
Explanation of Chemical Calculations for Histology Preparation
Fixation and Dehydration
Mounting
Safety and Disposal
References
JEOL JSM-6400 SEM
Basic Science
Form and Function
Signal Source and Detection
Interactive Parts Tour
Interactive Cutaway Tour
Safety Procedures
Operating Procedures
Imaging Techniques
Basic Imaging
Advanced Imaging
Microanalysis
EDS X-Ray Spectral Analysis
EDS X-Ray Mapping
WDS Quantitative Analysis Procedure
WDS X-Ray Mapping Overview
WDS X-Ray Mapping Procedure
Shut Down
FAQs
Troubleshooting
VIDEO: Specimen Loading Technique
VIDEO: Start Up Technique
VIDEO: Specimen Unloading Technique
Hitachi S-4700 FE-SEM
Basic Science
Form and Function 1
Form and Function 2
Chemical Analysis
Interactive Parts Tour
Interactive Cutaway Tour
Software Tour
Safety Procedures
Operating Procedures
Preliminary
Sample Exchange
Flashing
Imaging
Shut Down
Imaging Techniques
Backscatter Imaging
Charging
Specimen Types
Microanalysis
X-Ray Spectral Analysis
X-Ray Mapping
FAQs
Why Use FESEM?
Specimen Constraints
General FAQs
Troubleshooting
JEOL JEM-4000FX TEM
Basic Science
Why Use TEM?
Electron Source and Beam
Vacuum
Electron Diffraction
Microanalysis
Interactive Parts Tour
Interactive Cutaway Tour
Safety Procedures
Specimen Preparation
Preparation Options
Holder Types
Specimen Drying
Operating Procedures
Preliminary
Accelerating Voltage
Specimen Exchange
Filling ACDs
Heating the Filament
Initial Alignment
Condenser Aperture Setting
Gun Alignment
Condenser Astigmatism Correction
Gun and Condenser Lens Alignment
Z Height Adjustment
Condenser Double Deflector Alignment
High Voltage Centering Adjustment
Imaging Techniques
Basic Imaging
Objective Aperture Centering
Objective Stigmator Adjustment
Advanced Imaging
Recording Bright Field Micrographs
Recording Diffraction Micrographs
Film Plate Changing Procedure
Scanning Transmission Electron Microscopy (STEM)
Notes on Recording Micrographs
User Rules for Plate Changing
Gatan Camera
TEM Video Capture
Shut Down
FAQs
VIDEO: Specimen Loading and Unloading Technique
Interactive Alignment Demo
VIDEO: Alignment
Microanalysis
Basic Science
X-Rays and Spectra
Energy Dispersive Spectrometer
Wavelength Dispersive Spectrometer
Safety Procedures
EDS Versus WDS
Quantitative X-Ray Microanalysis
X-Ray Mapping
Basic Science
Interactive X-Ray Mapping Challenge
FAQs
Troubleshooting
Veeco Dimension 3000 Atomic Force Microscope
Overview
Tapping Mode Laser Alignment
Operating Procedures
Preliminary
Alignment
Operation
Image Viewing/Offline Operation
Shut Down
Fluorescence Microscopes
Basic Science
Fluorescence Optical Microscopy
Detection and Visualization
Zeiss AxioVert 200 M and ApoTome
Operating Procedures
Start Up
Basic Operation
Fluorescence Microscopy
Shut Down
Olympus BX51 and DP70
Operating Procedures
Start Up
Basic Operation
Fluorescence Microscopy
Shut Down
References
Support
System Requirements
Alternative Content
Contact
General Lab Safety
Disclaimers
Usage Permissions
